Electron & Ion Microscope Microscope

Sigma Family

Your ZEISS SIGMA FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy

ZEISS Sigma 300 delivers excellence in price and performance. Achieve your elemental analysis fast and convenient with the best-in-class EDS geometry of ZEISS Sigma 500. Count on accurate, reproducible results – from any sample, every time.

Get a flexible and reliable field emission SEM for your research, industrial lab or imaging facility. With the Sigma Family you always acquire excellent images from any real world sample.

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Flexible Detection for Clear Images

  • Tailor Sigma to your needs using the latest detection technology and characterize all of your samples.
  • Acquire topographical and compositional information with the optional InLens Duo detector.
  • Enjoy a new generation of secondary electron (SE) detectors. Obtain images with up to 50% more signal. Benefit from the novel C2D and VPSE detectors of Sigma in variable pressure mode: working at low vacuum, you can expect crisp images with up to 85% more contrast.

Automate and Speed up Your Workflow

  • A 4-step workflow lets you control all the functionality of your Sigma. Benefit from fast time-to-image and save time on training – especially in a multi-user environment.
  • First, navigate your sample and then set optimal imaging conditions.
  • Next, automatically acquire images across multiple samples utilizing regions of interest (ROIs). Finally use the workflow’s last step for contextual visualization of your results.

Perform Advanced Analytical Microscopy

  • Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples.
  • Get analytical data at half the probe current and twice the speed. 
  • Achieve complete, shadow-free analytics in your FE-SEM. Profit from using a short analytical working distance of 8.5 mm and a take-off angle of 35°.

Gemini Optics

Based on Proven Gemini Technology

  • The Gemini objective lens design combines electrostatic and magnetic fields to maximize optical performance while reducing field influences at the sample to a minimum. This enables excellent imaging, even on challenging samples such as magnetic materials.
  • The Gemini in-lens detection concept ensures efficient signal detection by detecting secondary (SE) and/or backscattered (BSE) electrons minimizing time-to-image.
  • Gemini beam booster technology guarantees small probe sizes and high signal-to-noise ratios.

Flexible Detection

Flexible Detection for Clear Images

  • Characterize all of your samples with the latest detection technology.
  • Get topographical, high resolution information with the novel ETSE and the Inlens detector for high vacuum mode.
  • Obtain crisp images in variable pressure mode with the VPSE or the C2D detector.
  • Produce high resolution transmission images with the aSTEM detector.
  • Investigate composition with the BSD4 or the YAG detector.