Electron & Ion Microscope Microscope

EVO LS

Your High Definition SEM for Workflow Automation

Discover substantial improvements in productivity through the 4-step workflow. Simplify routine imaging tasks and benefit from powerful automated features that deliver fast time to image and a reduction of training overhead, especially in a multi-user environment.

EVO is the most flexible high definition imaging and analysis tool delivering fast, accurate, repeatable results across all samples.

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Highlights

High Definition In All Vacuum Modes

  • Benefit from the latest detector technology to extract even more detail in high vacuum (HV), variable pressure (VP) and extended pressure (EP) modes.
  • Obtain crisp, sharp topographical details with the new secondary electron (SE) detector that delivers up to 50% more signal.
  • New VP and EP imaging detectors provide improved signal at higher pressures to visualize the finest surface details.

Intelligent Imaging – High Throughput

  • EVO delivers highest productivity in manufacturing and quality control.
  • Reduce 400 manual steps to only 15, imaging four points of interest on nine specimens at three different magnifications.
  • Automated Intelligent Imaging provides free-form regions of interest (ROIs) for unattended automated image acquisition.
  • SmartBrowse collects and presents your data as an interactive map to help you completely understand your sample.

As Flexible As It Is Easy To Use

  • Future-assured upgrade path ensures EVO can meet the challenge of rapidly growing application requirements.
  • A choice of chamber size and electron source ensures EVO can be perfectly configured for demanding imaging, EDS, WDS and EBSD applications.
  • Robust stage options provide the perfect platform for imaging large, heavy automotive and aerospace components.
  • Upgrade to a full environmental SEM to enable complete control over your sample for dynamic high pressure or water vapour experiments.