Your High Definition SEM for Workflow Automation Discover substantial improvements in productivity through the 4-step workflow. Simplify routine imaging tasks and benefit from powerful automated features that deliver fast time to image and a reduction of training overhead, especially in a multi-user environment. EVO is the most flexible high definition imaging and analysis tool delivering […]
Electron & Ion Microscope
Sigma Family
Your ZEISS SIGMA FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy ZEISS Sigma 300 delivers excellence in price and performance. Achieve your elemental analysis fast and convenient with the best-in-class EDS geometry of ZEISS Sigma 500. Count on accurate, reproducible results – from any sample, every time. Get a flexible and reliable field emission […]
GeminiSEM Family
Your FE-SEMs for Sub-Nanometer, Low Voltage Images Gemini Optics. Low Voltage. Variable Pressure. The GeminiSEM family stands for effortless imaging: get sub-nanometer resolution and high detection efficiency, even in variable pressure mode. GeminiSEM 500 combines proven Gemini technology with a novel electron optical design. Achieve better resolution, especially at low voltage. With 20 times greater […]
Pre-Owned Instruments, Certified by ZEISS
ZEISS Certified Pre-Owned Instruments Program ZEISS Certified Pre-Owned Electron Microscopes Program delivers fully reconditioned instruments with guaranteed performance at exceptional value. If your microscope has been doing its job for years, or even decades, it might be the right time for a new system. If your budget is limited or if you do not want to […]
FIB-SEM for High Throughput 3D
Discovering and Designing Advanced Materials With Ease With ZEISS Crossbeam you benefit from a 3D nano-workstation Combine imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) with the processing ability of a focused ion beam (FIB). During milling, imaging or when performing 3D analytics, Crossbeam will speed up your FIB applications. Make […]
ORION NanoFab
Helium Ion Microscope – move beyond sub-10nanometer imaging of charged specimens and nanofabrication applications 3-in-1 Multibeam Ion Microscope for Sub-10nm Nanostructuring Seamlessly switch between gallium, neon and helium beams with ORION NanoFab: Use the neon beam to machine nanostructures at great speed and achieve high throughput. Use the helium beam to create delicate sub-10 nm […]